• Atomic Force Microscope (Baso AFM/SPM) 

  • Extremely Easy to Use in One System Features:

  • Innovative: A novel optical astigmatism technique

  • Available: Unbelievable low price

  • Convenient: Easy to use and easy probe-changing

  • Flexible: LabVIEW software makes easy expansion

  • Modularization: Many different modules could be chosen.

  • Passive isolation is integrated.

  • Downlaod¡G

 
 
Specification

Main Functions

operation mode

 DC mode, AC mode

static force-distance

 Yes

dynamic force-distance

 Yes

phase Imaging

 Yes

automatic probe approach

 Yes

probe orientation adjustment

 Yes

Scanner (X/Y/Z)

scanning range

 20 £gm / 20 £gm / 2 £gm

drive resolution  0.3 nm / 0.3 nm / 0.03 nm

Z spatial resolution

 0.2 nm

Sample

size 

 diameter 10mm , thickness 5 mm 

maximum weight

 50 g

XY sample positioning

 10¡Ñ10 mm, motoized

AFM Software Function

operation system

 Windows XP/Vista

development platform  LabVIEW
communication interface  USB 2.0 (1.0, 1.1 compatibel)
raw data export  Yes ( txt file )
scan image export  Yes ( bmp file )
scanning mode  line / frame
scan angle  0~360 degree
real time flatten  line flatten / frame flatten

Image Analysis Functions

line profile measurement  Yes
contrast and bright adjustment  Yes

multiple color palettes

 Yes 

 3D image

 Yes 

height measurement 

 Yes 

roughness measurement

 Yes 

Electronics

 

stimultaneous image 

 3 channels 

 AD resolution

 16 bit

 AD sampling rate

 100

 power rating

 100~240V / 50~60Hz / 180W